Electrically Conductive
240AC-PP
Soft Tapping Mode AFM Cantilever with Pt Overall Coating
AFM Probe Specifications:
Coating
Additional Info
The 240AC-PP AFM probes are designed for tapping mode electrical characterization measurements such as Electrostatic Force Microscopy (EFM), Kelvin Probe Force Microscopy (KPFM), etc.
The tetrahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.
The overall platinum coating ensures high electrical conductivity and significantly enhances the AFM cantilever reflectivity.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Shape Optimized Positioning | Height 14 µm (12 - 16 µm)* | Setback 0 µm | Radius < 25 nm | Half Cone Angle 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Soft tapping mode AFM cantilever | Shape Beam | Force Const. 2 N/m(0.6 - 3.9 N/m)* | Res. Freq. 70 kHz(45 - 90 kHz)* | Length 240 µm(230 - 250µm)* | Width 40 µm(38 - 42µm)* | Thickness 2.6µm(2.1 - 3.1 µm)* |
* typical values
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*Olympus® is a trademark of Olympus Corporation
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