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3XC-NN
Multiple AFM Cantilevers without Coating for Various Applications
AFM Probe Specifications:
Coating
Additional Info
AFM probes of the 3XC series feature three different AFM cantilevers for various measurement modes:
- 500DC - Contact mode AFM cantilever
- 240AC - Soft tapping mode AFM cantilever for imaging soft samples
- 200AC - Standard tapping mode AFM cantilever
The tetrahedral AFM tips are located precisely at the free ends of the AFM cantilevers. This allows the AFM tips to be positioned accurately over the area of interest on the sample surface.
The uncoated AFM probe offers sharp AFM tip apexes, chemical inertness and high AFM cantilever Quality factors.
OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.
AFM Tip:
| Shape | Height | Setback | Radius | Half Cone Angle |
|---|---|---|---|---|
| Shape Optimized Positioning | Height 14 µm (12 - 16 µm)* | Setback 0 µm | Radius < 7 nm | Half Cone Angle 0° front, 35° back, <9° side |
* typical values
AFM Cantilever:
| Cantilever | Shape | Force Const. | Res. Freq. | Length | Width | Thickness |
|---|---|---|---|---|---|---|
| Cantilever Contact mode AFM cantilever | Shape Beam | Force Const. 0.3 N/m(0.1 - 0.6 N/m)* | Res. Freq. 17 kHz(11 - 22 kHz)* | Length 500 µm(490 - 510µm)* | Width 30 µm(28 - 32µm)* | Thickness 3µm(2.5 - 3.5 µm)* |
| Cantilever Standard tapping mode AFM cantilever | Shape Beam | Force Const. 9 N/m(2.8 - 21 N/m)* | Res. Freq. 150 kHz(100 - 200 kHz)* | Length 175 µm(165 - 185µm)* | Width 40 µm(38 - 42µm)* | Thickness 3µm(2.5 - 3.5 µm)* |
| Cantilever Soft tapping mode AFM cantilever | Shape Beam | Force Const. 2.5 N/m(0.75 - 5.3 N/m)* | Res. Freq. 75 kHz(50 - 100 kHz)* | Length 240 µm(230 - 250µm)* | Width 30 µm(28 - 32µm)* | Thickness 3µm(2.5 - 3.5 µm)* |
* typical values
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*Olympus® is a trademark of Olympus Corporation
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