240AC-SG

High Resolution Soft Tapping Mode AFM Cantilever with Au Reflective Coating

AFM Probe Specifications:
Coating

Reflective Gold

Additional Info

The 240AC-SG AFM probes with sharp diamond-like spikes are designed for high resolution tapping mode AFM imaging of soft samples.

The terahedral AFM tip is located precisely at the free end of the AFM cantilever. This allows the AFM tip to be positioned accurately over the area of interest on the sample surface.

The gold coating ensures high and stable laser reflectivity in air, vacuum and liquids. Please note that while the tetrahedral AFM tip and the AFM tip side of the AFM cantilever are gold coated, the diamond-like spike remains uncoated.

OPUS AFM probes are the ideal replacement for the discontinued Olympus®* AFM probes.

AFM Tip:
Shape Height Setback Radius
Shape Supersharp, Optimized Positioning Height 14 µm (12 - 16 µm)* Setback 0 µm Radius < 1 nm

* typical values

AFM Cantilever:
Cantilever Shape Force Const. Res. Freq. Length Width Thickness
Cantilever High resolution soft tapping mode AFM cantilever Shape Beam Force Const. 2 N/m(0.6 - 3.9 N/m)* Res. Freq. 70 kHz(45 - 90 kHz)* Length 240 µm(230 - 250µm)* Width 40 µm(38 - 42µm)* Thickness 2.6µm(2.1 - 3.1 µm)*

* typical values

#}
*Olympus® is a trademark of Olympus Corporation

Place an Order

Packages Price
Package
240AC-SG-5 5 per set (Price: 995 USD)
Quantity
Price 0.00 USD
* Total: 0 USD
Request a free sample