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OPUS AFM Probes: Optimized Positioning Upon Sample

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Standard Tapping Mode AFM Tips
Standard Tapping Mode AFM Tips AFM probes with high resonance frequency and high force constant for Tapping or Non-Contact Mode measurements
Soft Tapping Mode AFM Tips
Soft Tapping Mode AFM Tips AFM probes with medium soft AFM cantilevers for measurements in Soft Tapping or Force Modulation Mode
Contact Mode AFM Tips
Contact Mode AFM Tips AFM probes with soft and sensitive AFM cantilevers for Contact Mode or Lateral Force Microscopy measurements
Gold Coated AFM Tips
Gold Coated AFM Tips AFM probes with bio-compatible and chemically resistant gold coating for applications in Biology / Life Science
High Speed Scanning AFM Tips
High Speed Scanning AFM Tips AFM cantilevers with high resonance frequency in the megahertz range for High Speed Scanning applications
Conductive AFM Tips
Conductive AFM Tips AFM probes with platinum coating for electrical measurements such as EFM, KPFM, PFM and SCM
Magnetic AFM Tips
Magnetic AFM Tips AFM probes with cobalt alloy AFM tip coating for measurements in Magnetic Force Microscopy Mode
Ultrasharp AFM Tips
Ultrasharp AFM Tips AFM probes with diamond-like spikes for very high resolution imaging in Tapping or Non-Contact Mode
Carbon Nanofiber AFM Tips
Carbon Nanofiber AFM Tips AFM probes with durable high-aspect ratio spikes for reliable measurements on samples with deep trenches
Multiple AFM Cantilevers
Multiple AFM Cantilevers AFM probes combining four different AFM cantilevers for various measurement modes on a single chip