Olympus®* discontinued all their AFM probes. OPUS AFM probes are the ideal replacement!
In September 2022 Olympus®* Corp. decided to discontinue all their Olympus®* AFM probes - https://probe.olympus-global.com/en/support/discon/.
While Olympus®* are clearing their final inventory, we would like to explain why OPUS AFM probes are the ideal replacement on the market for all discontinued Olympus®* AFM probes.
OPUS AFM tips are identical to Olympus®* AFM tips in form, fit and function.
Comparison between OPUS AFM tips and Olympus®* AFM tips
OPUS AFM tip
vs
Olympus®* AFM tip
We have designed OPUS AFM tips to be an absolutely perfect replacement for all discontinued Olympus®* AFM tips, also known as Olympus®* MicroCantilevers. Therefore, to all former Olympus®* AFM probes users, who are looking for a stress-free-replacement solution – you have found it!
In the same way as the now discontinued Olympus®* AFM probes, our OPUS AFM probes feature:
- AFM tip at the very end of the AFM cantilever, enabling exact positioning on the sample,
- SOI wafer manufacturing,
- AFM tip and AFM cantilever defined using dry etching,
- AFM tip height of ~14µm and AFM tip radius of 7nm for all uncoated AFM tips.
In addition, OPUS AFM probes offer a wider product portfolio compared to the discontinued Olympus®* AFM probes, namely:
- a wider variety of functional coatings; not only aluminum, but also gold, platinum, magnetic coatings,
- a wider selection of base AFM cantilevers, including AFM probes with multiple AFM cantilevers on one AFM probe and silicon AFM cantilevers for Contact Mode measurements,
- High-Aspect-Ratio and Ultrasharp OPUS AFM tips.
What are the perfect OPUS AFM tips replacements for the discontinued Olympus®* AFM probes?
Below is a detailed replacement guide for each AFM probe that has been discontinued by Olympus®*, matched with the perfect OPUS replacement AFM probe.
If you have any further questions, please feel to write us or call us .
Olympus®* OMCL-AC160TS, a.k.a. AC160
The perfect OPUS replacement AFM probe is 160AC-NA .
The 160AC-NA is used for standard tapping or non-contact mode measurements. It features an AFM cantilever with nominal length 160µm, nominal resonance frequency 300kHz, nominal force constant 26N/m and an aluminum reflective coating.
Olympus®* OMCL-AC240TS, a.k.a. AC240
The perfect OPUS replacement AFM probe is 240AC-NA .
The 240AC-NA is used for soft tapping mode measurements. It features an AFM cantilever with nominal length 240µm, nominal resonance frequency 70kHz, nominal force constant 2N/m and an aluminum reflective coating.
Olympus®* OMCL-AC240TM, a.k.a. AC240TM
The perfect OPUS replacement AFM probe is 240AC-PP .
The 240AC-PP is used for electrical measurements such as EFM, KPFM, PFM and SCM. It features an AFM cantilever with nominal length 240µm, nominal resonance frequency 70kHz, nominal force constant 2N/m and an overall electrically conductive platinum coating.
Olympus®* OMCL-AC200TS, a.k.a. AC200
The perfect OPUS replacement AFM probe is 200AC-NA .
The 200AC-NA is used for standard tapping or non-contact mode measurements. It features an AFM cantilever with nominal length 200µm, nominal resonance frequency 135kHz, nominal force constant 9N/m and an aluminum reflective coating.
Olympus®* OMCL-AC55TS, a.k.a. AC55
The perfect OPUS replacement AFM probe is 55AC-NG .
The 55AC-NG is used for High Speed Scanning measurements. It features an AFM cantilever with nominal length 65µm, nominal resonance frequency 1200kHz, nominal force constant 85N/m and a gold reflective coating.
Unique OPUS AFM probes without previous equivalent at Olympus®*
In addition to Olympus®* replacement AFM probes, OPUS offers AFM probes that are unique on the market and give AFM users wider options and possibilities than Olympus®* AFM probes.
The OPUS 160AC series AFM probes are available without a coating – 160AC-NN , with a gold reflective coating – 160AC-NG and with an overall gold coating – 160AC-GG .
The OPUS 240AC series AFM probes are available without a coating – 240AC-NN , with a gold reflective coating – 240AC-NG and with an overall gold coating – 240AC-GG .
The OPUS 55AC series AFM probes are available without a coating – 55AC-NN and with an aluminum reflective coating – 55AC-NA .
The OPUS 240AC-MA AFM probe is designed for Magnetic Force Microscopy (MFM) measurements. It features a cobalt-alloy tip side coating and an aluminum reflective coating.
The OPUS 160AC-SG and 240AC-SG AFM probes are designed for high resolution imaging. They feature ultrasharp diamond-like spikes on top of the gold coated silicon AFM tips.
The OPUS 160AC-FG and 240AC-FG AFM probes are designed for measurements on samples with deep trenches. They feature durable high aspect-ratio carbon nanofibers on top of the gold coated silicon AFM tips.
The OPUS 3XC multiple-cantilever series AFM probes feature 3 AFM cantilevers on one side of the holder chip. The first AFM cantilever is designed for contact mode measurements with nominal length 500µm, nominal resonance frequency 17kHz and nominal force constant 0.3N/m. The second AFM cantilever is similar to the 200AC AFM cantilever with nominal length 175µm, nominal resonance frequency 150kHz and nominal force constant 9N/m. The third AFM cantilever is similar to the 240AC AFM cantilever with nominal length 240µm, nominal resonance frequency 75kHz and nominal force constant 2.5N/m. The 3XC series AFM probes are available without a coating – 3XC-NN , with an aluminum reflective coating – 3XC-NA and with an overall gold coating – 3XC-GG .
The OPUS 4XC multiple-cantilever series AFM probes feature 4 AFM cantilevers, two on each side of the holder chip. The first AFM cantilever is designed for contact mode measurements with nominal length 500µm, nominal resonance frequency 17kHz and nominal force constant 0.3N/m. The second AFM cantilever is similar to the 240AC AFM cantilever with nominal length 240µm, nominal resonance frequency 75kHz and nominal force constant 2.5N/m. The third AFM cantilever is similar to the 200AC AFM cantilever with nominal length 175µm, nominal resonance frequency 150kHz and nominal force constant 9N/m. The fourth AFM cantilever is similar to the 55AC AFM cantilever with nominal length 65µm, nominal resonance frequency 1200kHz and nominal force constant 100N/m. The 4XC series AFM probes are available without a coating – 4XC-NN and with an overall gold coating – 4XC-GG .
OPUS AFM tips are widely available and can be shipped immediately
In most regions of the world, especially in Europe, USA and Japan, OPUS AFM probes are available for immediate delivery without any lead time.
Order online on our website or from one of our distributors .
*Olympus® is a trademark of Olympus Corporation